http://hdl.handle.net/123456789/658 Mon, 06 Apr 2026 08:35:08 GMT 2026-04-06T08:35:08Z http://hdl.handle.net/123456789/14543 Spectroscopic ellipsometry : principles and applications Ellipsometry is a powerful tool used for the characterization of thin films and multi-layer semiconductor structures. This book deals with fundamental principles and applications of spectroscopic ellipsometry (SE). Beginning with an overview of SE technologies the text moves on to focus on the data analysis of results obtained from SE, Fundamental data analyses, principles and physical backgrounds and the various materials used in different fields from LSI industry to biotechnology are described. The final chapter describes the latest developments of real-time monitoring and process control which have attracted significant attention in various scientific and industrial fields Mon, 01 Jan 2007 00:00:00 GMT http://hdl.handle.net/123456789/14543 2007-01-01T00:00:00Z http://hdl.handle.net/123456789/12185 Symmetry theory in molecular physics with Mathematica : a new kind of tutorial book Martin McClain, William This volume describes the fundamentals of Mathematica in symmetry and group theory. The development and traits of character tables are described, in addition to methods for calculation. Physical applications are analyzed. Thu, 01 Jan 2009 00:00:00 GMT http://hdl.handle.net/123456789/12185 2009-01-01T00:00:00Z http://hdl.handle.net/123456789/10371 Técnica y práctica de espectroscopia Záidel, A.N.; Ostróvskaya, G.V.; Ostrovski, Yu.I. Thu, 01 Jan 1976 00:00:00 GMT http://hdl.handle.net/123456789/10371 1976-01-01T00:00:00Z